Wimmer, Y;
El-Sayed, A-M;
Goes, W;
Grasser, T;
Shluger, AL;
(2016)
Role of hydrogen in volatile behaviour of defects in SiO2-based electronic devices.
Proceedings of the Royal Society A
, 472
(2190)
, Article 2016009. 10.1098/rspa.2016.0009.