Wang, H;
Cai, B;
Pankhurst, MJ;
Zhou, T;
Kashyap, Y;
Atwood, R;
Le Gall, N;
... Sawhney, K; + view all
(2018)
X-ray phase-contrast imaging with engineered porous materials over 50 keV.
Journal of Synchrotron Radiation
, 25
(4)
pp. 1182-1188.
10.1107/S1600577518005623.
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Abstract
X-ray phase-contrast imaging can substantially enhance image contrast for weakly absorbing samples. The fabrication of dedicated optics remains a major barrier, especially in high-energy regions (i.e. over 50 keV). Here, the authors perform X-ray phase-contrast imaging by using engineered porous materials as random absorption masks, which provides an alternative solution to extend X-ray phase-contrast imaging into previously challenging higher energy regions. The authors have measured various samples to demonstrate the feasibility of the proposed engineering materials. This technique could potentially be useful for studying samples across a wide range of applications and disciplines.
| Type: | Article |
|---|---|
| Title: | X-ray phase-contrast imaging with engineered porous materials over 50 keV |
| Location: | United States |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1107/S1600577518005623 |
| Publisher version: | http://doi.org/10.1107/S1600577518005623 |
| Language: | English |
| Additional information: | Copyright © The Author(s), 2018. This article is distributed under the terms of the Creative Commons Attribution License, which provides for the re-use of the article in whole or part provided there is attribution for the article. |
| Keywords: | X-ray phase imaging, hard X-rays, high-energy regions, porous materials, random attenuation masks, speckle technique |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Engineering Science > Dept of Mechanical Engineering |
| URI: | https://discovery-pp.ucl.ac.uk/id/eprint/10052622 |
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