Matsunaga, N; Yano, K; Endrizzi, M; Olivo, A; (2020) Detection of individual sub-pixel features in Edge-Illumination X-Ray Phase Contrast Imaging by means of the dark-field channel. Journal of Physics D: Applied Physics , 53 (9) , Article 095401. 10.1088/1361-6463/ab5aa0.

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Abstract

We report on a direct comparison in the detectability of individual sub-pixel-size features between the three complementary contrast channels provided by edge-illumination x-ray phase contrast imaging at constant exposure time and spatial sampling pitch. The dark-field (or ultra-small-angle x-ray scattering) image is known to provide information on sample micro-structure at length scales that are smaller than the system's spatial resolution, averaged over its length. By using a custom-built groove sample, we show how this can also be exploited to detect individual, isolated features. While these are highlighted in the dark-field image, they remain invisible to the phase and attenuation contrast channels. Finally, we show images of a memory SD card as an indication towards potential applications.

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