Stockbridge, K; Chick, S; Crane, E; Fisher, A; Murdin, BN; (2020) Using non-homogeneous point process statistics to find multi-species event clusters in an implanted semiconductor. Journal of Physics Communications , 4 (1) , Article 015010. 10.1088/2399-6528/ab6049.

Preview

Text Stockbridge_2020_J._Phys._Commun._4_015010.pdf - Published Version Download (919kB) | Preview

Abstract

The Poisson distribution of event-to-ith-nearest-event radial distances is well known for homogeneous processes that do not depend on location or time. Here we investigate the case of a non-homogeneous point process where the event probability (and hence the neighbour configuration) depends on location within the event space. The particular non-homogeneous scenario of interest to us is ion implantation into a semiconductor for the purposes of studying interactions between the implanted impurities. We calculate the probability of a simple cluster based on nearest neighbour distances, and specialise to a particular two-species cluster of interest for qubit gates. We show that if the two species are implanted at different depths there is a maximum in the cluster probability and an optimum density profile.

Download activity - last month

Export as JSONXMLCSV

Download activity - last 12 months

Export as CSVXMLJSON

Downloads by country - last 12 months

Export as JSONCSVXML

Archive Staff Only

View Item