Landers, David;
Clancy, Ian;
Dunin-Borkowski, Rafal E;
Weber, Dieter;
Stewart, Andrew A;
(2023)
TEMGYM Advanced – NanoMi lens characterisation.
Micron
, 169
, Article 103450. 10.1016/j.micron.2023.103450.
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Abstract
A complete analysis including finite element method (FEM) calculation, focal length properties, and thirdorder geometric aberrations of the open-source electrostatic lens from the NanoMi project is presented. The analysis is carried out by the software TEMGYM Advanced, a free package developed to carry out ray-tracing and lens characterisation in Python. Previously TEMGYM Advanced has shown how to analyse the aberrations of analytical lens fields; this paper expands upon this work to demonstrate how to apply a suitable fitting method to discrete lens fields obtained via FEM methods so that the aberrations of real lens designs can be calculated. Each software platform used in this paper is freely available in the community and creates a free and viable alternative to commercial lens design packages.
| Type: | Article |
|---|---|
| Title: | TEMGYM Advanced – NanoMi lens characterisation |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1016/j.micron.2023.103450 |
| Publisher version: | https://doi.org/10.1016/j.ultramic.2023.113738 |
| Language: | English |
| Additional information: | This version is the author accepted manuscript. For information on re-use, please refer to the publisher’s terms and conditions. |
| Keywords: | Ray tracing, NanoMi, Parallelisation, Finite element method, Differential algebra, Aberration integral |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > Dept of Chemistry |
| URI: | https://discovery-pp.ucl.ac.uk/id/eprint/10168697 |
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