Onoda, J; Pang, CL; Yurtsever, A; Sugimoto, Y; (2014) Subsurface Charge Repulsion of Adsorbed H-Adatoms on TiO2(110). JOURNAL OF PHYSICAL CHEMISTRY C , 118 (25) 13674 - 13679. 10.1021/jp503402w.

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Abstract

We have used noncontact atomic force microscopy (NC-AFM) and Kelvin probe force microscopy (KPFM) to directly visualize the presence of charged subsurface impurities on rutile TiO2(110). The subsurface charges add an additional electrostatic force between the sample and tip so that they appear as hillocks in the NC-AFM topography. Analysis of several subsurface defects in the same NC-AFM image reveals that the hillocks have discrete heights, which means that defects at different subsurface levels can be detected and distinguished. H adatoms, which are positively charged at the TiO2(110) surface, were found to be repelled by the buried positive charge, so that they form a ∼80–120 Å wide hydrogen-free zone around the charge. Thus, there is an opportunity to deliberately add dopants in order to exclude or perhaps even to confine certain adsorbates to a local region at the surface.

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