Pelz, PM;
Guizar-Sicairos, M;
Thibault, P;
Johnson, I;
Holler, M;
Menzel, A;
(2014)
On-the-fly scans for X-ray ptychography.
Applied Physics Letters
, 105
(25)
, Article 251101. 10.1063/1.4904943.
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Abstract
With the increasing importance of nanotechnology, the need for reliable real-time imaging of mesoscopic objects with nanometer resolution is rising. For X-ray ptychography, a scanning microscopy technique that provides nanometric resolution on extended fields of view, and the settling time of the scanning system is one of the bottlenecks for fast imaging. Here, we demonstrate that ptychographic on-the-fly scans, i.e., collecting diffraction patterns while the sample is scanned with constant velocity, can be modelled as a state mixture of the probing radiation and allow for reliable image recovery. Characteristics of the probe modes are discussed for various scan parameters, and the application to significantly reducing the scanning time is considered.
| Type: | Article |
|---|---|
| Title: | On-the-fly scans for X-ray ptychography |
| Open access status: | An open access version is available from UCL Discovery |
| DOI: | 10.1063/1.4904943 |
| Publisher version: | http://dx.doi.org/10.1063/1.4904943 |
| Language: | English |
| Additional information: | The following article appeared in Pelz, PM; Guizar-Sicairos, M; Thibault, P; Johnson, I; Holler, M; Menzel, A; (2014) On-the-fly scans for X-ray ptychography. Applied Physics Letters, 105 (25), Article 251101. and may be found at: http://dx.doi.org/10.1063/1.4904943. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. |
| UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences |
| URI: | https://discovery-pp.ucl.ac.uk/id/eprint/1478378 |
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