Huang, X;
Conley, R;
Bouet, N;
Zhou, J;
Macrander, A;
Maser, J;
Yan, H;
... Chu, YS; + view all
(2015)
Achieving hard X-ray nanofocusing using a wedged multilayer Laue lens.
Optics Express
, 23
(10)
pp. 12496-12507.
10.1364/OE.23.012496.
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Abstract
We report on the fabrication and the characterization of a wedged multilayer Laue lens for x-ray nanofocusing. The lens was fabricated using a sputtering deposition technique, in which a specially designed mask was employed to introduce a thickness gradient in the lateral direction of the multilayer. X-ray characterization shows an efficiency of 27% and a focus size of 26 nm at 14.6 keV, in a good agreement with theoretical calculations. These results indicate that the desired wedging is achieved in the fabricated structure. We anticipate that continuous development on wedged MLLs will advance x-ray nanofocusing optics to new frontiers and enrich capabilities and opportunities for hard X-ray microscopy.
Type: | Article |
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Title: | Achieving hard X-ray nanofocusing using a wedged multilayer Laue lens |
Location: | United States |
Open access status: | An open access version is available from UCL Discovery |
DOI: | 10.1364/OE.23.012496 |
Publisher version: | http://dx.doi.org/10.1364/OE.23.012496 |
Language: | English |
Additional information: | Copyright © 2015 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited. |
UCL classification: | UCL UCL > Provost and Vice Provost Offices > UCL BEAMS UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences UCL > Provost and Vice Provost Offices > UCL BEAMS > Faculty of Maths and Physical Sciences > London Centre for Nanotechnology |
URI: | https://discovery-pp.ucl.ac.uk/id/eprint/1483776 |
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